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Wang, J.*; Hatano, Yuji*; Toyama, Takeshi*; Suzudo, Tomoaki; Hinoki, Tatsuya*; Alimov, V. Kh.*; Schwarz-Selinger, T.*
Journal of Nuclear Materials, 559, p.153449_1 - 153449_7, 2022/02
Times Cited Count:3 Percentile:68.71(Materials Science, Multidisciplinary)To study the effect of the content of chromium (Cr) in the tungsten (W) matrix on the vacancy formation and retention of hydrogen isotopes, the samples of the W-0.3Cr alloy were irradiated with 6.4 MeV Fe ions in the temperature range of 523-1273 K. These displacement-damaged samples were exposed to D gas at a temperature of 673 K. The addition of 0.3% Cr into the W matrix resulted in a significant decrease in the retention of deuterium compared to pure W after irradiation especially at high temperature. Positron lifetime for W-0.3Cr alloy irradiated at 1073 K was almost similar to that for non-irradiated one. These facts indicate the suppression of the formation of vacancy-type defects by 0.3% Cr addition.
Sueyoshi, Tetsuro*; Nishimura, Takahiro*; Fujiyoshi, Takanori*; Mitsugi, Fumiaki*; Ikegami, Tomoaki*; Ishikawa, Norito
Superconductor Science and Technology, 29(10), p.105006_1 - 105006_7, 2016/10
Times Cited Count:8 Percentile:37.83(Physics, Applied)A systematic investigation of flux pinning by widely direction-dispersed columnar defects (CDs) in YBaCuOy thin films was carried out by using heavy-ion irradiation: a parallel configuration of CDs aligned along the -axis, and two trimodal splay configurations composed of crossing CDs; relative to the -axis, where the splay plane defined by the three irradiation angles is perpendicular (trimodal-A) or parallel (trimodal-B) to the transport current direction. The trimodal configurations show high pinning efficiency over a wide range of magnetic field orientations compared to the parallel one at low magnetic field. In particular, trimodal-B shows the higher critical current density of the two trimodal configurations.
Sato, Shinichiro; Schmieder, K. J.*; Hubbard, S. M.*; Forbes, D. V.*; Warner, J. H.*; Oshima, Takeshi; Walters, R. J.*
Proceedings of 42nd IEEE Photovoltaic Specialists Conference (PVSC-42) (CD-ROM), 5 Pages, 2015/06
GaAs pn-junction diodes with embedded InAs quantum dots (QDs) are irradiated with protons and the generated deep level traps are investigated using Deep Level Transient Spectroscopy (DLTS). The results are compared to GaAs pn-junction diodes without QDs in order to identify the origin of the deep level traps. The fluence dependence of trap density is investigated, and it is shown that majority carrier traps induced by irradiation increase in proportion to the fluence whereas the EL2 trap, which appears before irradiation, is not affected by irradiation. In addition, minority carrier traps in the QD layer and electron/hole emission from QD levels are investigated by various reverse bias and pulse voltage conditions.
Pastuovi, *; Capan, I.*; Cohen, D.*; Forneris, J.*; Iwamoto, Naoya*; Oshima, Takeshi; Siegele, R.*; Hoshino, Norihiro*; Tsuchida, Hidekazu*
Nuclear Instruments and Methods in Physics Research B, 348, p.233 - 239, 2015/04
Times Cited Count:7 Percentile:51.25(Instruments & Instrumentation)Matsuura, Hideharu*; Kagamihara, So*; Ito, Yuji*; Oshima, Takeshi; Ito, Hisayoshi
Physica B; Condensed Matter, 376-377, p.342 - 345, 2006/04
Times Cited Count:8 Percentile:38.44(Physics, Condensed Matter)no abstracts in English
Ekins-Daukes, N. J.*; Arafune, Koji*; Lee, H. S.*; Sasaki, Takuo*; Yamaguchi, Masafumi*; Khan, A.*; Takamoto, Tatsuya*; Agui, Takaaki*; Kamimura, Kunio*; Kaneiwa, Minoru*; et al.
Proceedings of 31st IEEE Photovoltaic Specialists Conference and Exhibition (PVSC-31), p.683 - 686, 2005/00
no abstracts in English
Umeda, Takahide*; Isoya, Junichi*; Morishita, Norio; Oshima, Takeshi; Kamiya, Tomihiro; Gali, A.*; Dek, P.*; Son, N. T.*; Janzn, E.*
Physical Review B, 70(23), p.235212_1 - 235212_6, 2004/12
Times Cited Count:44 Percentile:83.59(Materials Science, Multidisciplinary)no abstracts in English
Kawasuso, Atsuo; Weidner, M.*; Redmann, F.*; Frank, T.*; Krause-Rehberg, R.*; Pensl, G.*; Sperr, P.*; Triftshuser, W.*; Ito, Hisayoshi
Materials Science Forum, 389-393, p.489 - 492, 2002/05
no abstracts in English
Khan, A.*; Yamaguchi, Masafumi*; Oshita, Yoshio*; Dharmarasu, N.*; Araki, Kenji*; Abe, Takao*; Ito, Hisayoshi; Oshima, Takeshi; Imaizumi, Mitsuru*; Matsuda, Sumio*
Journal of Applied Physics, 90(3), p.1170 - 1178, 2001/08
Times Cited Count:56 Percentile:86.43(Physics, Applied)1MeV-electron and 10MeV-proton irradiations into Si doped various impurities such as B, Ga, O and C were performed and residual defects in the Si were studied using DLTS and C-V measurements.It was revealed that Ci-Oi whose level is Ev-0.36 eV and Bi-Oi whose energy is Ec-0.18eV were generated. In Ga-doped Si, the generation of Ci-Oi was suppressed. Since Ci-Oi acts as scattering center, this result indicates that the radiation resistance of solar cells is improved by using Ga-doped Si substrates.Furthermore, a new defect level (Ev+18eV) was observed in Ga-dpoed Si by irradiation. This defect level was annealed out above 350 C.
Kawasuso, Atsuo; Redmann, F.*; Krause-Rehberg, R.*; Sperr, P.*; Frank, T.*; Weidner, M.*; Pensl, G.*; Ito, Hisayoshi
Materials Science Forum, 353-356, p.537 - 540, 2001/00
no abstracts in English
*; *; *; *; Hasegawa, Makoto; Hirano, Koichiro
JNC TY9400 2000-007, 50 Pages, 2000/03
no abstracts in English
Nishikawa, Masabumi*; Baba, Atsushi*; *; Kawamura, Yoshinori
Fusion Engineering and Design, 39-40, p.615 - 625, 1998/00
Times Cited Count:14 Percentile:73.06(Nuclear Science & Technology)no abstracts in English
D.Cha*; Ito, Hisayoshi; Morishita, Norio; Kawasuso, Atsuo; Oshima, Takeshi; ; J.Ko*; K.Lee*; Nashiyama, Isamu
Mater. Sci. Forum, 264-268, p.615 - 618, 1998/00
no abstracts in English
; *; *; Ito, Yasuo*
Applied Surface Science, 85(2), p.229 - 238, 1995/01
Times Cited Count:11 Percentile:57.88(Chemistry, Physical)no abstracts in English
Shiraishi, Kensuke; *; *; *
Japanese Journal of Applied Physics, 31(12A), p.L1675 - L1678, 1992/12
Times Cited Count:0 Percentile:0(Physics, Applied)no abstracts in English
; Takamura, Saburo; *; *
Physical Review B, 46(22), p.14411 - 14418, 1992/12
Times Cited Count:6 Percentile:39.36(Materials Science, Multidisciplinary)no abstracts in English
*; *; *; *
Japanese Journal of Applied Physics, 31(8A), p.L1037 - L1040, 1992/08
Times Cited Count:5 Percentile:32.82(Physics, Applied)no abstracts in English
Ito, Hisayoshi; Yoshikawa, Masahito; Nashiyama, Isamu; *; Okumura, Hajime*; Yoshida, Sadafumi*
J. Electron. Mater., 21(7), p.707 - 710, 1992/00
Times Cited Count:67 Percentile:94.38(Engineering, Electrical & Electronic)no abstracts in English
Shiraishi, Kensuke; ; *
Japanese Journal of Applied Physics, 30(4A), p.L578 - L581, 1991/04
Times Cited Count:6 Percentile:38.71(Physics, Applied)no abstracts in English
Shiraishi, Kensuke;
High Temperature Superconductors, p.325 - 332, 1991/00
no abstracts in English